Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Terahertz Science and Technology
سال: 2020
ISSN: 2156-342X,2156-3446
DOI: 10.1109/tthz.2020.2999631