Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration

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ژورنال

عنوان ژورنال: IEEE Transactions on Terahertz Science and Technology

سال: 2020

ISSN: 2156-342X,2156-3446

DOI: 10.1109/tthz.2020.2999631